Reliability Issues with Automotive CMOS Image Sensors

You must be logged in to watch this session

First Name*

Last Name*

Job Title

Company Name

Country of Residence*

Work E-mail Address*

Password*

Confirm Password*

Your personal data will be used to support your experience throughout this website, to manage access to your account, and for other purposes described in our privacy policy.

Sense Media, on behalf of AutoSens, needs the contact information you provide to us to update you with information about AutoSens and our products. You may unsubscribe from these communications at anytime. For information on how to unsubscribe, as well as our privacy practices and commitment to protecting your privacy, check out our privacy policy.

Only fill in if you are not human

Reliability Issues with Automotive CMOS Image Sensors

Event: AutoSens Europe

| Session date: Wednesday 9th October

Session date: Wednesday 9th October

, 2024

Hear from:

Albert Theuwissen

Founder,

Harvest Imaging

Albert Theuwissen

Founder,

Harvest Imaging

A commercially available CMOS image sensor (intended for automotive applications) is extensively tested w.r.t. reliability (temperature, humidity, storage, …). Remarkably : most of the tests are passed very successfully with 100 % yield, unfortunately not all of them. Some tests clearly show an issue with the performance of the devices. During the talk more technical details about the various tests and their outcome will be disclosed. Further research to find the root cause of the reliability issues will be discussed as well.