Interview with Ross Jatou of ON Semiconductor and Junko Yoshida of EE Times
AutoSens Brussels edition featured an exclusive interview led by Junko Yoshida, Global Editor-in-Chief of EE Times, with Ross Jatou, VP and GM of the Automotive Solutions Division at ON Semiconductor. Covering topics from driver monitoring to edge processing, NCAP testing and sensor fusion, this is a great insight into the state-of-the-art for automotive sensors, and a hint at what we might see in production soon, plus some thoughts on industry requirements in the short to medium term.
Listen in full here:
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